IEC TS 62607-5-3:2020
(Main)Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
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Standards Content (Sample)
IEC TS 62607-5-3
®
Edition 1.0 2020-04
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –
Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge
carrier concentration
IEC TS 62607-5-3:2020-04(en)
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IEC TS 62607-5-3
®
Edition 1.0 2020-04
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –
Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge
carrier concentration
INTERNATIONAL
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ICS 07.030; 07.120 ISBN 978-2-8322-8073-7
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® Registered trademark of the International Electrotechnical Commission
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– 2 – IEC TS 62607-5-3:2020 IEC 2020
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Sample structures . 6
4.1 Metal/insulator/semiconductor (MIS) structure . 6
4.2 Thin-film specimens with the van der Pauw configuration . 7
5 Criteria for choosing a method for measuring carrier concentration in organic
semiconductor layers . 8
6 Appropriate data formats . 8
Annex A (informative) Case study of carrier concentration measurements of organic
mater
...
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