IEC TS 61994-4-4:2018
(Main)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
IEC TS 61994-4-4:2018 is available as IEC TS 61994-4-4:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61994-4-4:2018 gives the terms and definition for single crystal wafers for surface acoustic wave (SAW) devices representing the state of the art. This edition includes the following significant technical changes with respect to the previous edition:
- the new terms and definitions given in IEC 62276:2016 have been taken into account;
- the general title has been changed according to the change in the title of TC 49 in 2009.
- the part title has been changed according to the title of IEC 62276:2016.
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IEC TS 61994-4-4
®
Edition 3.0 2018-11
TECHNICAL
SPECIFICATION
Piezoelectric, dielectric and electrostatic devices and associated materials for
frequency control, selection and detection – Glossary –
Part 4-4: Piezoelectric materials – Single crystal wafers for surface acoustic
wave (SAW) devices
IEC TS 61994-4-4:2018-11(en)
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IEC TS 61994-4-4
®
Edition 3.0 2018-11
TECHNICAL
SPECIFICATION
Piezoelectric, dielectric and electrostatic devices and associated materials for
frequency control, selection and detection – Glossary –
Part 4-4: Piezoelectric materials – Single crystal wafers for surface acoustic
wave (SAW) devices
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 01.040.31; 31.140 ISBN 978-2-8322-6178-1
Warning! Make sure that you obtained this publication from an authorized distributor.
® Registered trademark of the International Electrotechnical Commission
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– 2 – IEC TS 61994-4-4:2018 © IEC 2018
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 There are no normative references in this document.Terms and definitions . 5
3.1 Single crystals for SAW wafer . 5
3.2 Terms and definitions related to LN and LT crystals . 6
3.3 Terms and definitions related to all crystals . 7
3.4 Flatness . 7
3.5 Definitions of appearance defects .
...
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